Modeling of thermally stimulated currents in PTFE

The experimental evidence obtained by the combination of heat pulse and TSC techniques has provided a picture of the trap structure in PTFE. With the experimentally determined activation energies, a model has been formulated that accurately describes the TSC results. This model is based on trap controlled transport with the experimentally justified approximation that when a carrier escapes out of a trap, it immediately leaves the sample without being retrapped. Five traps were identified in the temperature range of interest with corresponding activation energies of 1.3 (2), 1.4, 1.5, and 1.7 eV. These activation energies together with the temperature maxima yield escape frequencies in the range of 10
¹¹
to 10
¹³
sec
⁻¹
.