Fundamental parameter determination to improve spectroscopical methods

In view of the lack of reference-materials and calibration samples, in particular at the nanoscale, reliable quantification schemes in x-ray fluorescence analysis and related methods call for higher accuracy of relevant x-ray fundamental parameters such as photoionisation cross sections, decay rates, line widths, and fluorescence yields, as well as Coster-Kronig and transition probabilities. The presentation will summarize relevant results and new methodologies employed in recent x-ray fundamental parameter determinations.