Designing TRL standards for accurate measurements of 120° accesses CPW devices

CPW devices with orthogonal or bended accesses (120° in our case) measurements after VNA calibration with conventional (straight) set of standards may generate additional errors. The design and the characterization of first calibration standards with 120° accesses are proposed. These standards will be used for 2-ports vector network analyzer TRL calibration. This work concerns S-parameters measurements of bended accesses planar devices in the range 20 GHz to 67 GHz.