Balancing lifetime and soft-error reliability to improve system availability

CMOS scaling has greatly increased concerns for lifetime reliability due to permanent faults and soft-error reliability due to transient faults. Most existing works only focus on one of the two reliability concerns, but often times techniques used to increase one type of reliability may adversely impact the other type. A few efforts do consider both types of reliability together and use two different metrics to quantify the two types of reliability. However, for many systems, the concern of the user is to maximize system availability by improving the mean time to failure (MTTF), regardless of whether the failure is caused by permanent faults or transient faults. Addressing this concern requires a uniform metric to measure the effect due to both types of faults. In this paper, we derive a novel analytical expression for calculating the MTTF due to transient faults. Using this new formula and an existing method to evaluate system MTTF, we formulate and solve the problem of maximizing system availability with consideration of permanent faults, transient faults, and throughput constraint. Extensive simulations of synthetic task sets and benchmarks based on real-world applications were performed to validate our algorithm.