Stress-tolerant fully inkjet-printed Reed Relays

A fully printed micro-electro-mechanical (MEM) Reed Relay is demonstrated to provide zero off-state leakage (I
OFF
), low on-state resistance (R
ON
) (∼15 Ω), and moderate switching delay (∼32 µs), while offering excellent immunity to mechanical stress variations in the printed cantilevers. Leveraging the stress gradient in sintered metal nanoparticles films and using a novel device architecture, this device is promising for large area electronics.