Using Termination Effect to Characterize Electric and Magnetic Field Coupling Between TEM Cell and Microstrip Line

In this paper, we change terminal loads of a microstrip line to separate electric field coupling and magnetic field coupling between a microstrip line and a transverse electromagnetic (TEM) cell during radiated emission measurement. Such separation can also be validated by another terminal load. After validation, the effect of termination on both couplings is investigated, and the requirements of termination impedance to suppress the two couplings are revealed. In addition, we find that the linear physical models deriving both lumped coupling parameters only hold below a limited frequency.