Strain-mediated voltage control of a Ni/NiO spontaneous exchange bias (SEB) system

Exchange bias refers to magnetic anisotropy from coupled antiferromagnetic - ferromagnetic (AFM-FM) systems due to interfacial exchange effects. Electric control of exchange bias provides an additional degree of freedom for designing next-generation magnetic memory and logic devices. Control of conventional exchange bias (CEB), using both charge and strain mediated effects, has been previously demonstrated in the literature, but similar control of spontaneous exchange bias (SEB), a related phenomenon, has not been previously studied. The purpose of this presentation is to explore electrical control of SEB.