A high-speed electron beam profile monitor for the synchrotron radiation source

The real-time processing of the electron beam parameters is a necessary procedure to optimize the key characteristics of the synchrotron radiation source. To study multi-bunch beam instabilities a high-speed electron beam profile monitor is developed. The device described must continuously implement 15625000 measurements of the vertical or horizontal electron beam profile at 16 points with a time resolution of 5 ns at 50 MHz rate.