Effect of doping in the current voltage characteristics of organic diodes

We analyze the effects of doping, traps and other defects on the electronic properties of organic/polymeric diodes. We detect the presence of dopant atoms and traps in the semiconductor in experimental current density-voltage (j-V) curves by the comparison with numerical j-V curves. The transport equations are solved by means of the Lambert-W-function. The key parameter in the procedure is the boundary value for the free carrier density at the metal-organic interface.