A new accelerated method for evaluating the ELDRS of bipolar operational amplifiers: Temperature switching approach

A temperature switching approach is introduced to evaluate the enhanced low-dose-rate sensitivity (ELDRS) of bipolar operational amplifiers (op-amps). Experimental results have shown that temperature switching approach can well reproduce the low-dose-rate radiation damage of bipolar op-amps. The basis of the temperature switching approach is space charge model which can explain the ELDRS. According to the space charge model, the underlying mechanism of this accelerated evaluation approach is discussed.