Beamtest results of Lattice LFE2M20E FPGA

This paper presents beamtest data of the Lattice Semiconductor LFE2M20E, a 90nm SRAM FPGA, for use in areas under effects of ionizing radiation. It includes Single Event Effects (SEE) cross-section and maximum Total Ionizing Dose (TID) response. The device was irradiated with protons and heavy ions using particle accelerators at different beam time experiments.