Interference effects of multiple pulses on microcontroller

In order to investigate the interference effect of multiple pulses on modern microelectronic devices, a test module based on CAN (Controller Area Network) bus technique for distributed control is designed. More than a hundred modules are prepared for statistic test. Pulse injection test is carried out to measure the variation of interference threshold under electromagnetic pulse (EMP). The threshold voltage under two situations, multiple pulses with different number and with different time interval are considered. Accumulative effects of multiple pulses are observed and discussed.