High resolution electron microscopy study of atomic structure and morphology of InSb films in AlAs matrix

The study of structural and morphological features has been carried out using high resolution electron microscopy (HREM). The subjects of inquiry have been grown by molecular beam epitaxy and have been prepared in cross section (110) and plan view (100). Islands have been found in solid solution In
_x
Al
_1-x
Sb
_y
As
_1-y
, which formed under different growth conditions. Concentration of In, Sb has been estimated in these islands. Possible ways of defects originating in the islands have been discussed.