Study of Excess Noise Factor Under Nonlocal Effect in Avalanche Photodiodes

Avalanche photodiodes with thin multiplication regions exhibit a linear relationship between F(M) and M, which differs from the local-field model. This letter presents a study of the relationship between F(M) with M when nonlocal effects are significant. Systematic Monte Carlo simulations on different avalanche photodiodes have been carried out to support the analytical model.