Quality assurance in memory built-in self-test tools

In the paper, two methods of ensuring high quality of the memory built-in self-test tools are presented. The described ideas illustrate general methods and are applicable to any commercial memory BIST tool. The first solution describes controller emulation in order to validate each step of the real controller's operations. The second approach presents a way to determine the test algorithms' fault coverage by means of the memory fault simulator. The experimental results show functional benefits and effectiveness of the proposed solutions.