Set level at speed HTOL test for reliability qualification of high speed mobile applications

Similar to At Speed HTOL (ASH) [1], the study of Vmin-shift induced failure on Application Processor (AP) is stretched to the “set level” stress test. The set level test enables to filter out unscreened functional or power related early fails particularly with high frequency and heavy duty scenario-based software test and as a result, field failure rate is significantly reduced. We'll discuss the system level stress tests and its perspective as the current and future qualification required for new product introduction of high speed mobile applications.