Short papers: Quantification of optical deflection by laser-structured ZnO:Al

Anovel camera-based measurement setup fully quantifies the transmitted radiation deflected by textured front electrodes for thin-film solar cells. The conventional measurement of angular intensity distribution only analyzes one polar plane. The new setup examines the optical scattering and/or diffraction over the complete hemisphere. The hemispheric intensity distribution of laser-structured ZnO:Al proves reduced specular transmission and, hence, improved light trapping.