On measurement of parameters of programmable microelectronic nanostructures under accelerating extreme conditions (Xilinx 28nm XC7Z020 Zynq FPGA)

This paper presents a method and results from measurement of internal parameters of Xilinx XC7Z020 Zynq device - the programmable microelectronic nanostructures designed on 28 nm TSMC's technology. The presented method utilizes undersampling approach and a very easy way of processing of BRAM data streams. The presented flexible circuits have been used in various measurements of timing parameters delays in FPGAs, up to measurements or detection of the aging issues. The paper presents surprising overview of such measurements with the key result, that the usability of the latest 28 nm devices under accelerated conditions is strictly limited to lower frequencies or significantly lower temperatures. It also significantly limits the possibility of study of aging effects under accelerated conditions and might affect security applications. The paper extends the measurements and results available from previous technology nodes and tries to uncover new information and areas of the latest high-end technologies.