Advanced methodologies for atomic-scale nanofabrication and dynamic characterization

Based on the idea of “setting up a nanolab inside a transmission electron microscopy (TEM)”, we review our recent progress in atomic resolution nanofabrication and dynamic characterization of individual nanostructures and nanodevices. The electron beam can be used as a tool to induce nanofabrication on the atomic scale. Additional probes from a special-designed holder provide the possibility to further manipulate and measure the electrical properties of the nanostructures. All phenomena from the in-situ TEM experiments can be recorded in real time with atomic resolution.