Testing an integrated analog filter in a chip

Systems on chip are not being able to be tested like the systems on chart, but there exist potential solutions with this problem. Integrated Test techniques, as Built In Self-service Test (BIST), facilitate the test and carry it out in the chip. Because of these techniques, it is possible to reduce the cost and time of test, To have access to internal connections of the circuit and to avoid the probes and the cables between the tester and the legs of the components of circuit, which introduce distortions on the analog signal. Our study is interested to test the analog part of systems on chip (SOC), particularly filters. By applying the analysis technique of the power spectral densities (PSD), and basing on comparison parameters, we could detect the circuit faults to less than 20% of change in value of an integrated component in the SOC, and evaluated the sensibility of used technique.