A low-cost method for test and speed characterization of digital integrated circuit prototypes

A novel method for the high-speed test and characterization of digital integrated circuit prototypes has been developed. It utilizes a specially developed off-chip processor and supporting circuitry that is to be included on the prototype chip to facilitate the test and characterization process. The processor administers the user-defined test, receives and stores the test results. The test procedure and data is downloaded to the processor's memory through a standard interface. The supporting circuitry receives the test data serially from the processor, apply it to the selected circuit within the IC, collect and reformat the test results and send it to the processor. It also includes a high-frequency configurable clock generator to be used for performance characterization of the prototyped circuits. This allows the interface between the processor and the prototype chip to be fixed with any circuits being prototyped and tested. This unique hybrid solution, enables testing at full speed with minimal cost compared to the current method of using highspeed test equipments. The proposed method was validated with a complete prototype using FPGAs. A complete layout of the onchip support circuitry with 4 circuit prototypes had a total area of ~0.01 mm
²
using Lfoundry's 150 nm technology.