IC diagnosis: industry issues

A new failure analysis paradigm is necessary-a shift from hardware-based techniques to software-based methods. The transition is a daunting task because of its complexity. As with other successful practices in microelectronics, including design and testing, it is expected that a suite of software applications will be necessary to thoroughly diagnose complex ICs. These tools should be able to run concurrent with or independent of production testing. When running concurrent with testing, they should be able to provide at least a pareto distribution of the dominant failure modes and mechanisms. Approaches include electrical behavior description using defect classes and high level heuristics compatible with VHDL design tools. It is critical that those working in IC design and test understand the rapidly increasing need for software diagnosis tools and support their development for the semiconductor industry.