A yield model for the evaluation of topologically constrained chip architectures

Conventional M-out-of-N yield models can only roughly represent many practical chip architectures. On the other hand, representative models have the drawback of computational complexity. A yield model is introduced that overcomes the limits of existing models and provides ease of computation and predictability in approximation levels. The model is versatile enough to be included in CAM/CAD programming environments. Some application examples are given to illustrate the model accuracy, ease of use, and flexibility.<
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