Improved testability evaluations in combinational logic networks

Two methods for the calculation of fault detection probabilities in combinational networks are presented. These methods provide a better accuracy than existing algorithms and a deeper insight into the effects of first order correlations to multiple fan-out reconvergencies. These techniques have been applied to standard benchmarks as well as to a few commercial circuits and have shown to provide a significant improvement compared with existing methods with minimal drawbacks in terms of required computing resources.<
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