A design strategy for 8 kV/contact 15 kV/air gap IEC 61000-4-2 robustness without on board suppressors

We present an IC design strategy capable of achieving 8 kV contact/15 kV air gap ESD robustness in-system according to the IEC 61000-4-2 standard without the need of additional suppressors on board. This result has been achieved with a LVTSCR, developed via wafer level TLP/HBM/HMM testing and verified in system using gun testing.