Multifractal characterization of Laplacian fractals

This paper presents a multifractal approach to characterizing, or fingerprinting, the structural complexity of similar-looking, yet different, discharge trees caused by dielectric breakdown. Multifractal characterization of Laplacian fractals involves the computation of a spectrum of fractal dimensions, providing much more information than is possible from just a single fractal dimension. This allows us to measure and analyze the sensitivity of the generated discharge trees to various model parameters and to various mathematical techniques.