BIST using Cellular Automata as test pattern generator and response compaction

In the Built-in self-test (BIST), a pseudo-random generator is used to apply test vectors to the circuit under test and a data compactor is used to produce a signature. This paper verifies that a linear hybrid Cellular Automata (CA) as a test pattern generator has a maximum length cycle and better random properties, and such CA as a signature analyzer have the same aliasing properties as linear feedback shift registers.