Noise and gain in frequency mixers with NbN SIS junctions

We study noise and conversion gain in the SIS mixers with Nb/MgO/NbN junctions at the millimeter and submillimeter wavelengths in order to estimate the possibility to extent the low noise operation towards the theoretical limit of 4/spl Delta//h=2.4 THz. We present as preliminary result the lowest achieved receiver noise with NbN SIS junctions of 65 K with conversion gain of -6 dB at 162 GHz and 230 K receiver noise with conversion gain of -10 dB at 306 GHz. The junction area is 2 /spl mu/m/sup 2/ and Josephson critical current density is 1.4 KA/cm/sup 2/. The optimum R/sub N//spl omega/C of NbN junction for mixers is estimated as 600 GHz/V. In preliminary tests the junctions R/sub N//spl omega/C is 10-20 time superior to the optimum and a significant improvement of NbN SIS mixers may be expected. The noise sources in the NbN SIS junctions are studied and a possible mixer sensitivity improvement is discussed. The thermal properties of the SIS NbN are studied. The frequency limit of the low loss integrated tuning structure in NbN is estimated as at least as 1.5 THz.