Strategy for laser-based waveform metrology for frequencies ranging from below 1 GHz to 1 THz

We present a strategy for the traceable characterization of coplanar and coaxial components with femtosecond-laser-based electro-optic sampling. This technique will be applicable to a wide frequency range from below 1 GHz to 1 THz and, thus, outperforms previous techniques. An application example is given, which might be used to characterize a coplanar-coaxial microwave probe.