CDM event simulation in SPICE: A holistic approach

A flow and a CAD tool for the simulation of the ESD CDM classification test event in SPICE is described. The methodology consists of deconstructing the CDM test into its relevant components. The modeling and calibration of each component is shown to be essential in the development of a generic simulation approach predicting CDM pass and fail levels. The successful implementation of the flow is demonstrated with a real circuit design example.