Development of a device characterization curve tracer based on transient thermal measurement

This paper describes the development of a power device characterization curve tracer based on transient thermal measurement. Experimental test set ups along with the required conditions to mitigate the measurement errors are discussed. The measurement algorithms are implemented in LabVIEW environment as a set up controller. The junction temperature is maintained at the specified set point for carrying out the transient measurement procedure using a developed proportional integral-differential (PID) temperature controller. A power MOSFET is used as the device under test.