Influence of interface effect on the ferroelectric and ferromagnetic properties of CFO/PMNT multilayered thin films

The CoFe
₂
O
₄
/Pb(Mg
_1/3
Nb
_2/3
)O
₃
-PbTiO
₃
(CFO/PMNT) multilayer thin films have been prepared on LaNiO
₃
/SiO
₂
/Si(100) substrate using radio frequency magnetron sputtering method. The smooth, dense and crack-free surface of CFO/PMNT multilayer thin film shows the excellent crystal quality with root-mean-square (RMS) roughness only 2.9nm. The influence of the interface effect, film thickness, period number n and crystallite orientation of CFO/PMNT multilayer thin films on their ferroelectric and ferromagnetic properties were investigated. The related mechanism was also discussed.