Broadband Scanning Microwave Microscopy investigation of graphene

In this work we describe the application of a dual-channel scanning probe microscope performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) - developed by ourselves- to a graphene flake. In our system we introduce a conversion in Time-Domain to discriminate the desired information, achieving high quality microwave images with nanometric resolution. The graphene sample is deposited on a substrate of SiO
2
with an additional deposition of gold (a contact finger). The preliminary measurements seem to show evidence of localized change of impedance near the edge of the flake.