A new method to optimize function verification

In present, due to increasing complexity and scale of digital design, verification efficiency, coverage and reusability have been aspects that people care about most [1][2]. In practical verification of EMI (External Memory Interface), we accumulate many experiences and conclude some rules. Based on these experiences and rules, a new method to optimize is proposed in this paper. From verification results, we prove that verification time is evidently shortened, all function points are covered and the testbench is reusable.