A probe for making near-field measurements with minimal disturbance: the optically modulated scatterer

We describe an optically modulated scatterer as an electric-field probe for measuring radio-frequency and microwave fields. It has a high spatial resolution and the ability to operate very close to conducting and dielectric objects without appreciable distortion of the field to be measured. Thus, it can scan close to antennas and diffracting metal structures. We describe how the electric field is deduced from the measurements and present gain measurements and far-field patterns deduced from near-field scans of antennas. The results are tested by comparing them with those obtained by established measurement techniques.