Verilog-A Modeling of Radiation-Induced Mismatch Enhancement

Physical model of TID effects is embedded into BSIM3v3 model implemented using Verilog-A. Radiation-induced mismatch enhancement due to the combined action of technology variations and electrical bias difference is demonstrated by simulation. It is shown that the total ionizing dose degradation of circuit components under inequivalent electric field conditions could lead to mismatch of internal circuit parameters, which results in a change to circuit output mismatch parameters.