Triggering of transient latch-up (TLU) by system level ESD

This paper investigates the influences of the temperature and the trigger parameters (width and rise time) on the threshold of transient latch-up (TLU). It is shown that temperature is a much more critical parameter than transient trigger parameters. For high discharge currents which are typical for system level surges as e.g. cable discharge events, even very short trigger pulses can cause TLU.