On the speckle pattern interferometry analysis of instrument errors

Photoelectron interference speckle class precision equipment by many factors, often below standard detection accuracy This paper will mainly measurement error are discussed. Summarizes the error detection system consists of two parts, namely, system error and random error. In this paper the causes that produce these errors were analyzed, Clearly the accuracy of the detection system and a number of parameters. More accurately calculate the size of the various error, clear all errors on the measurement of the degree Proposed to reduce and eliminate these errors specific measures. This type of equipment to improve manufacturing precision, and the proper use of such equipment with some guidance.