State-of-the-art microwave device characterization using large-signal network analyzers

This paper presents a snapshot of key large-signal network analysis capabilities enabling state-of-the-art microwave device characterization. An overview of different large-signal network analyzer configurations with the source- and load-pull techniques is given. Next, we report on the modulation capabilities that allow the characterization of high- and low-frequency effects which occur typically in active devices for wireless communication applications.