Study of nonlinear modeling for microwave diode based measurement

Nonlinear modeling of microwave diode is discussed in this paper. A measurement system is set up based on the conception of nonlinear scattering functions and the principle of measuring is introduced. A microwave schottky diode's partial scattering functions is extracted and compared with the simulated results in Serenade and results agree well. Nonlinear scattering functions can be used as a new tool to character nonlinear microwave device and our system can extract scattering functions accurately.