A study of a variable-capacitance drain network's influence on dynamic behavioral modeling of an RF power amplifier

An investigation of the complex-valued parameters of two different dynamic behavioral models due to changes in the drain decoupling network of a PA has been performed. The study is based on complex-envelope measurements on a real PA. The complex coefficients of the parallel Hammerstein (PH) and the optimal pole placements of the Kautz-Volterra (KV) models are analyzed. It is concluded that the parameters follow smooth, predictable functions and that the KV poles give a robust description of the PA's memory effects compared with the PH model.