Four point probe method based on LOG112 and C8051F006 SoCs for resistivity measurement

A four point probe-based resistivity meter using LOG112 and C8051F006 SoCs has been developed. The resistivity meter was calibrated and examined. Current-voltage characteristic-based resistances of resistors are consistent with those labeled to the resistors. Resistivities of the resistors are independent of the injected current, which agree with theory. The resistivity of TiO
2
thin film depends on the injected current due to minority and/or majority carrier injection.