Model design of non-volatile SRAM based on Magnetic Tunnel Junction

Recently there has been considerable interest in MTJ based MRAM because of its promising characteristics exhibiting high non-volatility combined with high density and radiation hardness as well as nondestructive readout (NDRO), very high radiation tolerance higher write/erase endurance compared to the FRAMs, and virtually unlimited power-off storage capability. This paper presents the design of static random access memory (SRAM) cell followed by MTJ that makes SRAM cell non-volatile, in which the output of SRAM cell having logic state 0 and 1 changes the direction of the moment of the free magnetic layer which is used for the information storage in MTJ device.