Dynamic test emulation for EDA-based mixed-signal test development automation

This paper presents the analysis and development of an Electronic Design Automation (EDA)-based Test Development Automation (TDA) system. We explore the need for such a system and provide a real example of the system at work. The focus of the paper is the concept of dynamic test emulation which understands that a mixed-signal test often consists of obtaining information from a large number of measurements taken at different times through the use of complex digital and analog test patterns. Our work concentrates on bringing together two existing communities, EDA and test development, by linking their separate environments and providing a platform for test and device development that does not require the existence of a physical integrated circuit and a physical Automatic Test Equipment (ATE) system.