Analysis of the propagation of electromagnetic disturbances inside integrated circuits using direct power injection and near-field scanning

This paper demonstrates how the direct power injection (DPI) and near-field scan (NFS) methods can be used to investigate the propagation of electromagnetic waves inside an integrated circuit (IC). In this study, a two-dimensional near-field cartography of the magnetic field generated by the circuit under test is achieved either in normal operation or while applying DPI into the V
_dd
pin of the IC, in order to visualize wave propagation. An unshielded (lidless) version of the test chip is used, making it easier to identify emission sources. Preliminary results demonstrate that the propagation of EM waves into a circuit depends not only on the impedance profile of the power supply network, but also on different EMI protection strategies implemented into the IC.