PLABEK: a complete automatic test pattern generation system for break faults in programmable logic arrays

In this paper, a complete PLA break fault ATPG system, PLABEK, is proposed. PLABEK contains four main parts: 1) break fault collapsing; 2) pruning algorithm based test pair generation; 3) serial-fault-injection parallel-bit-operation event-driven break fault simulation; and 4) testability-measure-based fault ordering. Experimental results show that PLABEK can generate complete compact test sequences for PLA's break faults very fast.