Scattering of an on-axis arbitrarily-shaped focused electromagnetic beam by a dielectric elongated spheroidal object

Scattered intensities distributions and an angular scattering of a dielectric elongated spheroidal object illuminated with an on-axis, polarized, and focused electromagnetic beam are computed. The shape of the beam can be arbitrarily chosen. The angular spectrum of plane waves method is used to model the beam. The plane waves constructing the beam are expanded in vector spherical harmonics. The scattered and internal electric field intensities of the object are calculated using the T-matrix method. The combination technique of the angular spectrum of plane waves method and the T-matrix method is capable to calculate the intensities for an elongated axisymmetric object illuminated with a focused incident beam. Also this combination can be used to calculate the intensities of an elongated spheroids illuminated with off-axis, focused and arbitrarily-shaped electromagnetic beam.