A Novel Method to Realize Soft Defect Localization Techniques without a Synchronization Signal for Failure Analysis

Failure analysis on advanced logic and mixed signal ICs more and more has to deal with so called ‘soft defect’. In this paper, a novel method to realize Soft Defect Localization (SDL) techniques without a synchronization signal for failure analysis is presented. We will present experimental results showing the accuracy of this method in order to help failure analysis to localize defect in short time.