Reliability of Thermoelectric Couple Networks Based Upon Couple Catastrophic Failures

A limited reliability mathematical model for series-parallel configurations of semiconductor couples used in radioisotopic thermoelectric generators (RTGs) is constructed. The model represents catastrophic failure reliability, which is only one important part of the total effective reliability mathematical model. It is deliberately narrow; two other major components of couple reliability, drift and load mismatch, are not discussed. The synthesis of the model, its use, and limitations are described. Probability relationships between the availability of a minimum specified power level and the assurance of electrical continuity form the framework of the model. The configuration under study is similar to internal arrangements of other power devices such as solar cells and battery cells. Here, open circuit is considered the only failure mode, viz., the probability of short circuit is negligible. The model can be applied to other power devices. Its algorithm form is suitable for adaption to a computer code.