A result on the relationship between input fanout index and line fanout index in combinational networks

Designing switching circuits that contain a limited number of fanout points is essential for enhancing performance of test generation, simulation, and verification tools. We consider the definitions of input fanout index, /spl tau/, and line fanout index, /spl mu/, of a switching function, and we prove a theorem showing the relation existing between these two parameters. Parameters /spl tau/ and /spl mu/ are very useful in the design of circuits with low fanout.